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Co-author Dr. Michael Shur received the Best Reliability Paper Award at the 26th International Conference on Microelectronics

Dr. Michael Shur

Co-author Dr. Michael Shur with K. Fobelets (lead), S. Rumyantsev, W. Van Roy, and R. Vanheertum received the Best Reliability Paper Award at the 26th International Conference on Microelectronics (MIEL 2008). They received the award for their paper: Correlation Between Flicker Noise and Current Linearity in Ferromagnetic-GaAs-metal Tunnel Contacts.

Read the Abstract here:
Correlation between flicker noise and current linearity in ferromagnetic-GaAs-metal tunnel contacts

Download the Paper here:
PDF version

Posted: Jul 28, 2008