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	Dr. Leila Parsa wins the Young Investigator Award
	Kane Named P.K. Lashmet Professor at Rensselaer
	IMAX Filmmakers Push Scientists To The Max
	Green Idea Wins 500,000 Euros
	Professor-Turned-Producer Learns the Movie Biz
	Rensselaer Researcher Wins AIChE Young Investigator Award
	Professor Michael Jensen appointed founding Technical Editor for Applications in Thermal Science and Engineering
	Ruel Appointed to WEPAN Board
	Co-author Dr. Michael Shur received the Best Reliability Paper Award at the 26th International Conference on Microelectronics
	Rensselaer Professor B. Wayne Bequette Elected Fellow of AIChE
	In Memoriam: Professor C. James Li
	Rensselaer Researcher Wins IEEE Award for Work on 3-D Computer Chips
	Commencement 2008: Rensselaer Student Invents Alternative to Silicon Chip
	Commencement 2008: First Woman Leader of Rensselaers Car-Building Club To Start New Career With General Motors
	Commencement 2008: Future Astronaut Aiming for Space
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	Engineering Students Win Tau Beta Pi Scholarships
	Renowned CUNY Professor Receives Davies Medal
	Rensselaer's Graduate Programs Rank Among the Best in the Nation
	John A. Focht National Chi Epsilon Scholarship
	Chris Morrison wins the W. H. Peterson Best Poster Award
	E. V. Murphree Award in Industrial & Engineering Chemistry
	Remembering Ralph B. Peck
	Professor Emeritus Robert H. Doremus
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	Duquette Named Horton Professor of Materials Engineering at Rensselaer
	Computer Vision Expert To Head Electrical, Computer, and Systems Engineering at Rensselaer

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Co-author Dr. Michael Shur received the Best Reliability Paper Award at the 26th International Conference on Microelectronics

Dr. Michael Shur

Co-author Dr. Michael Shur with K. Fobelets (lead), S. Rumyantsev, W. Van Roy, and R. Vanheertum received the Best Reliability Paper Award at the 26th International Conference on Microelectronics (MIEL 2008). They received the award for their paper: Correlation Between Flicker Noise and Current Linearity in Ferromagnetic-GaAs-metal Tunnel Contacts.

Read the Abstract here:
Correlation between flicker noise and current linearity in ferromagnetic-GaAs-metal tunnel contacts

Download the Paper here:
PDF version

Posted: Jul 28, 2008