Co-author Dr. Michael Shur received the Best Reliability Paper Award at the 26th International Conference on Microelectronics
Co-author Dr. Michael Shur with K. Fobelets (lead), S.
Rumyantsev, W. Van Roy, and R. Vanheertum received the Best
Reliability Paper Award at the 26th International Conference on
Microelectronics (MIEL 2008). They received the award for their
paper: Correlation Between Flicker Noise and Current Linearity
in Ferromagnetic-GaAs-metal Tunnel Contacts.
Read the Abstract here:
Correlation between flicker noise and current linearity in
ferromagnetic-GaAs-metal tunnel contacts
Download the Paper here:
PDF version
Posted:
Jul 28, 2008
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